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Standards [CURRENT]

DIN EN IEC 61788-17 ; VDE 0390-17:2023-06

Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films (IEC 61788-17:2021); German version EN IEC 61788-17:2021
Edition 2023-06

Standards [CURRENT]

ISO 16531

Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
Edition 2020-10

Standards [CURRENT]

OVE EN IEC 61788-17

Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films (german version)
Edition 2023-07-01

Standards [CURRENT]

SN EN IEC 61788-17

Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
Edition 2021-06

Standards [CURRENT]

NF C31-888-17 ; NF EN IEC 61788-17:2021-06-11

Superconductivity - Part 17: electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
Edition 2021-06-11

Standards [CURRENT]

BS EN IEC 61788-17

Superconductivity. Electronic characteristic measurements. Local critical current density and its distribution in large-area superconducting films
Edition 2021-06-16

Standards [CURRENT]

DIN EN 62226-2-1 ; VDE 0848-226-2-1:2005-09

Exposure to electric or magnetic fields in the low and intermediate frequency range - Methods for calculating the current density and internal electric field induced in the human body - Part 2-1: Exposure to magnetic fields - 2D models (IEC 62226-2-1:2004); German version EN 62226-2-1:2005
Edition 2005-09

Standards [CURRENT]

SN EN 1062-6

Paints and varnishes - Coating materials and coating systems for exterior masonry and concrete - Part 6: Determination of carbon dioxide permeability
Edition 2002-07

Standards [CURRENT]

DIN EN 62226-3-1 ; VDE 0848-226-3-1:2019-05

Exposure to electric or magnetic fields in the low and intermediate frequency range - Methods for calculating the current density and internal electric field induced in the human body - Part 3-1: Exposure to electric fields - Analytical and 2D numerical models (IEC 62226-3-1:2007 + A1:2016); German version EN 62226-3-1:2007 + A1:2017
Edition 2019-05

Standards [CURRENT]

DIN EN 62415

Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010
Edition 2010-12

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