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DIN EN IEC 60749-30
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020
Edition
2023-02
DIN EN 165000-2
Film and hybrid integrated circuits - Part 2: Internal visual inspection and special tests; German version EN 165000-2:1996
Edition
1996-11
