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Standards [CURRENT]

DIN ISO 16592

Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method (ISO 16592:2012)
Edition 2015-12

Standards [CURRENT]

DIN EN 1071-4

Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA); German version EN 1071-4:2006
Edition 2006-05

Standards [CURRENT]

DIN ISO 15632

Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2021)
Edition 2022-09

Standards [CURRENT]

BS ISO 23692

Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
Edition 2021-04-20

Standards [CURRENT]

BS ISO 14595

Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
Edition 2023-06-14

Standards [CURRENT]

BS ISO 11938

Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
Edition 2013-04-30

Standards [CURRENT]

BS ISO 14594

Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
Edition 2024-06-10

Standards [CURRENT]

BS ISO 17470

Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Edition 2014-01-31

Standards [CURRENT]

BS ISO 22489

Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
Edition 2016-10-31

Standards [CURRENT]

UNE-EN 1071-4

Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA) (Endorsed by AENOR in April of 2006.)
Edition 2006-04-01

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