Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
Edition 2010-12

Total reflection X-ray fluorescence - Principles and definitions
Edition 2022-05

Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (IEC 60747-16-6:2019); German version EN IEC 60747-16-6:2019
Edition 2021-08

Optical atomic spectral analysis - Principles and definitions
Edition 2013-11

Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (IEC 60747-16-7:2022); German version EN IEC 60747-16-7:2023
Edition 2024-04

Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (IEC 62047-1:2016); German version EN 62047-1:2016
Edition 2016-12

Graphical symbols for diagrams - Part 2: Symbol elements, qualifying symbols and other symbols having general application (IEC 60617-2:1996); German version EN 60617-2:1996
Edition 1997-08

Graphical symbols for diagrams - Part 5: Semiconductors and electron tubes (IEC 60617-5:1996); German version EN 60617-5:1996
Edition 1997-08

Ergonomics of human-system interaction - Part 302: Terminology for electronic visual displays (ISO 9241-302:2008); German version EN ISO 9241-302:2008
Edition 2009-06

Mechanical vibration - Resilient elements used in railway tracks - Part 4: Analytical evaluation of insertion loss of mounted track systems
Edition 2008-07