Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006); German version EN 62373:2006
Edition 2007-01

Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices (IEC 63373:2022); German version EN IEC 63373:2022
Edition 2023-08

Tabular layouts of article characteristics for transistors and thyristors
Edition 1988-12

Standard data element types with associated classification scheme for electric components - Part 4: IEC reference collection of standard data element types and component classes (IEC 61360-4:2005); German version EN 61360-4:2005, text in English
Edition 2005-11

Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010
Edition 2010-12

Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
Edition 2005-03

Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
Edition 1992-04

Function blocks - Part 2: Software tool requirements (IEC 61499-2:2012); German version EN 61499-2:2013
Edition 2014-09

Long duration storage of electronic components - Specification for implementation; German version CLC/TS 50466:2006
Edition 2006-12

Plastics - Environmental Aspects - Vocabulary; German version EN 17615:2022
Edition 2022-12