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OVE EN IEC 63284
Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors (IEC 47/2681/CDV) (english version)
Edition
2021-04-01
OVE EN IEC 63419
Guideline for Switching Reliability Evaluation procedures for Gallium Nitride Power Conversion Devices (IEC 47/2744/CDV) (english version)
Edition
2022-02-15
PR NF C96-284 ; PR NF EN IEC 63284
Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors
PR NF C96-419 ; PR NF EN IEC 63419
Guideline for Switching Reliability Evaluation procedures for Gallium Nitride Power Conversion Devices
22/30447579 DC
BS EN 63419. Guideline for Switching Reliability Evaluation procedures for Gallium Nitride Power Conversion Devices
Edition
2022-01-20
23/30479765 DC
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
Edition
2023-09-25
BS IEC 63229
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Edition
2023-08-31
BS IEC 63284
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Edition
2022-11-30
JIS H 1368
Method for determination of gallium in aluminium and aluminium alloys
Edition
2005-12-20
EIA JEP 180.01
Guideline for Switching Reliability Evaluation Procedures for Gallium Nitride Power Conversion Devices
Edition
2021-01
