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CAN/CSA-ISO/IEC 23002-1 AMD 1
Information technology - MPEG video technologies - Part 1: Accuracy requirements for implementation of integer-output 8×8 inverse discrete cosine transform - Amendment 1: Software for integer IDCT accuracy testing (Adopted Amendment 1:2008 to ISO/IEC 23002-1:2006)
Edition
2009
CAN/CSA-ISO/IEC 23002-1-08
Information technology - MPEG video technologies - Part 1: Accuracy requirements for implementation of integer-output 8×8 inverse discrete cosine transform
Edition
2008-09-01
CAN/CSA-ISO/IEC 23002-2
Information technology - MPEG video technologies - Part 2: Fixed-point 8×8 inverse discrete cosine transform and discrete cosine transform (Adopted ISO/IEC 23002-2:2008, first edition, 2008-06-01)
Edition
2018-09-01
CSA ISO/IEC 14888-3
IT Security techniques - Digital signatures with appendix - Part 3: Discrete logarithm based mechanisms (Adopted ISO/IEC 14888-3:2018, fourth edition, 2018-11)
Edition
2019-10-01
CSA ISO/IEC 18370-2
Information technology - Security techniques - Blind digital signatures - Part 2: Discrete logarithm based mechanisms (Adopted ISO/IEC 18370-2:2016, first edition, 2016-07-01)
Edition
2020-03-01
IPC DW-425A
Design and End Product Requirements for Discrete Wiring Boards
Edition
1990-05
OEVE/OENORM EN 62149-3-4
Basic standards for discrete/integrated optoelectronic semiconductor devices for fibre optic communications including hybrid devices - Part 3-4: Package interface standard - Interface standard for SC-SIP 9 pin fibre optic terminal device (IEC 86C/294/CDV)
Edition
2000-12-01
OEVE/OENORM EN 62153-2
Metallic telecommunication cable test methods - Part 2: Pulse/step return loss from measurement in the frequency domain using the Inverse Discrete Fourier Transformation (IDFT) (IEC 46A/487/CDV)
Edition
2002-10-01
OVE EN IEC 63215-2
Endurance test methods for die attach materials - Part 2: Temperature cycling test method for die attach materials applied to discrete type power electronic devices (IEC 91/1787/CDV) (english version)
Edition
2022-07-15
OVE EN IEC 63275-1
Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability (IEC 47/2679/CDV) (english version)
Edition
2021-04-01