Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022
Edition 2024-05

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017); German version EN 60749-28:2017
Edition 2018-02

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022
Edition 2024-12

Field device integration (FDI) - Part 100: Profiles - Generic protocols (IEC 62769-100:2020); English version EN IEC 62769-100:2020
Edition 2021-08

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification (IEC 62575-1:2015); German version EN 62575-1:2016
Edition 2016-09

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (IEC 62604-1:2022); German version EN IEC 62604-1:2022
Edition 2024-03

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification (IEC 60862-1:2015); German version EN 60862-1:2015
Edition 2016-04

Field device integration (FDI) - Part 115-2: Profiles - Modbus-RTU (IEC 62769-115-2:2020); English version EN IEC 62769-115-2:2020
Edition 2022-09

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021); German version EN IEC 63287-1:2021
Edition 2023-09

Function blocks (FB) for process control and electronic device description language (EDDL) - Part 2: Specification of FB concept (IEC 61804-2:2018); German version EN IEC 61804-2:2018
Edition 2018-12