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Standards [CURRENT]

ABNT NBR 14695

Subducts and microducts systems for telecommunication - Verification the curvature resistance
Edition 2020-01-23

Standards [CURRENT]

BS ISO 14490-9

Optics and photonics. Test methods for telescopic systems. Test methods for field curvature
Edition 2019-09-20

Standards [CURRENT]

UNE-EN ISO 10545-20

Ceramic tiles - Part 20: Determination of deflection of ceramic tiles for calculating their radius of curvature (ISO 10545-20:2022)
Edition 2022-11-30

Standards [CURRENT]

UNE-EN 1416

TOUCH AND CLOSE FASTENERS. DETERMINATION OF CURVATURE.
Edition 1997-05-22

Standards [CURRENT]

UNE-EN 62047-16

Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods (Endorsed by AENOR in August of 2015.)
Edition 2015-08-01

Standards [CURRENT]

SAE J 1246

Measuring the Radius of Curvature of Convex Mirrors
Edition 2021-10-15

Standards [CURRENT]

DIN EN 1416

Touch and close fasteners - Determination of curvature; German version EN 1416:1996
Edition 1997-01

Standards [CURRENT]

DIN ISO 14490-9

Optics and photonics - Test methods for telescopic systems - Part 9: Test methods for field curvature (ISO 14490-9:2019)
Edition 2021-01

Standards [CURRENT]

DIN EN ISO 10545-20

Ceramic tiles - Part 20: Determination of deflection of ceramic tiles for calculating their radius of curvature (ISO 10545-20:2022); German version EN ISO 10545-20:2022
Edition 2022-09

Standards [CURRENT]

DIN EN 62047-16

Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods (IEC 62047-16:2015); German version EN 62047-16:2015
Edition 2015-12

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