Semiconductor devices. Discrete devices. Bipolar transistors
Edition 2011-02-28

Thermal Impedance Measurements for Insulated Gate Bipolar Transistors
Edition 1991-10

Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 2: Modular multilevel converters (IEC 62751-2:2014 + A1:2019 + AMD2:2023); German version EN 62751-2:2014 + A1:2019 + A2:2023
Edition 2024-07

Thermal Impedance Measurement for Insulated Gate Bipolar Transistors (Delta VCE(on) Method)
Edition 2004-06

Thermal Impedance Measurements for Bipolar Transistors (Delta Base- Emitter Voltage Method)
Edition 1990-11

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Edition 2020

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2010); German version EN 60749-34:2010
Edition 2011-05

Semiconductor devices - Discrete devices - Insulated-gate bipolar transistors (IGBTs)
Edition 2019-11-22

Standard data element types with associated classification scheme for electric components - Part 4: IEC reference collection of standard data element types and component classes (IEC 61360-4:2005); German version EN 61360-4:2005, text in English
Edition 2005-11

Tabular layouts of article characteristics for transistors and thyristors
Edition 1988-12