Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008
Edition 2008-10

Nuclear instrumentation - Housed scintillators - Test methods of light output and intrinsic resolution (IEC 62372:2021); German version EN IEC 62372:2022
Edition 2023-03

Test method to measure the efficiency of air filtration media against spherical nanomaterials - Part 1: Size range from 20 nm to 500 nm (ISO 21083-1:2018); German version EN ISO 21083-1:2018
Edition 2019-09

Water quality - Gross beta activity - Test method using thick source (ISO 9697:2018); German version EN ISO 9697:2019
Edition 2020-12

Fire detection and fire alarm systems - Part 27: Duct smoke detectors; German version EN 54-27:2015
Edition 2015-05

Air filters for general ventilation - Part 2: Measurement of fractional efficiency and air flow resistance (ISO 16890-2:2022); German version EN ISO 16890-2:2022
Edition 2023-12

Test method to measure the efficiency of air filtration media against spherical nanomaterials - Part 2: Size range from 3 nm to 30 nm (ISO/TS 21083-2:2019); German version CEN ISO/TS 21083-2:2019
Edition 2019-11

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008)
Edition 2008-12-01