Determination of barium, nickel and other elements in cosmetics and tattoo products by atomic emission spectrometry with inductively coupled plasma (ICP-OES) after pressure digestion
Edition 2020-10

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Determination of 31 elements in high-purity nitric acid by ICP-MS
Edition 2014-11

Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)
Edition 2024-01

Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)
Edition 2007-02

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6: Determination of 36 elements in a high-purity ammonium fluoride solution (NH₄F) and in etching mixtures of high-purity ammonium fluoride solution containing hydrofluoric acid
Edition 2014-11

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS
Edition 2018-04

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 8: Determination of 33 elements in high-purity sulfuric acid by ICP-MS
Edition 2022-08

Pigments and extenders - Determination of matter soluble in hydrochloric acid - Part 16: Determination of 12 elements by inductively coupled plasma atomic emission spectroscopy
Edition 2023-09

Measurement of fiber optic elements - Part 1: Determination of attenuation of optical fibres; Text in German and English
Edition 2015-09

Measurement of fiber optic elements - Part 2: Determination of spectral transmittance of light guides
Edition 2024-02