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EIA JESD 22-A117E
Electrically Erasable Programmable ROM (EEPROM) Program / Erase Endurance and Data Retention Stress Test
Edition
2018-11
DIN EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020
Edition
2023-03
DIN EN 61131-1
Programmable controllers - Part 1: General information (IEC 61131-1:2003); German version EN 61131-1:2003
Edition
2004-03
DIN EN ISO/IEC 19762-1
Information technology - Automatic identification and data capture (AIDC) techniques - Harmonized vocabulary - Part 1: General terms relating to AIDC (ISO/IEC 19762-1:2008); German version EN ISO/IEC 19762-1:2012
Edition
2012-06
DIN EN 61964
Integrated circuits - Memory devices pin configurations (IEC 61964:1999); German version EN 61964:1999
Edition
2000-01
DIN EN 15213-3
Intelligent transport systems - After-theft systems for the recovery of stolen vehicles - Part 3: Interface and system requirements in terms of short range communication system; German version EN 15213-3:2013
Edition
2013-08
DIN EN 16603-70-01
Space engineering - On-board control procedures; English version EN 16603-70-01:2015
Edition
2015-04
DIN EN 61709
Electric components - Reliability - Reference conditions for failure rates and stress models for conversion (IEC 61709:2011); German version EN 61709:2011
Edition
2012-01
DIN EN 726-5
Identification card systems - Telecommunications integrated circuit(s) cards and terminals - Part 5: Payment methods; German version EN 726-5:1999
Edition
2000-05
DIN EN 14908-1
Open Data Communication in Building Automation, Controls and Building Management - Control Network Protocol - Part 1: Protocol Stack; English version EN 14908-1:2014
Edition
2014-08