Electrically Erasable Programmable ROM (EEPROM) Program / Erase Endurance and Data Retention Stress Test
Edition 2018-11

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020
Edition 2023-03

Programmable controllers - Part 1: General information (IEC 61131-1:2003); German version EN 61131-1:2003
Edition 2004-03

Integrated circuits - Memory devices pin configurations (IEC 61964:1999); German version EN 61964:1999
Edition 2000-01

Information technology - Automatic identification and data capture (AIDC) techniques - Harmonized vocabulary - Part 1: General terms relating to AIDC (ISO/IEC 19762-1:2008); German version EN ISO/IEC 19762-1:2012
Edition 2012-06

Electric components - Reliability - Reference conditions for failure rates and stress models for conversion (IEC 61709:2011); German version EN 61709:2011
Edition 2012-01

Intelligent transport systems - After-theft systems for the recovery of stolen vehicles - Part 3: Interface and system requirements in terms of short range communication system; German version EN 15213-3:2013
Edition 2013-08

Space engineering - On-board control procedures; English version EN 16603-70-01:2015
Edition 2015-04

Identification card systems - Telecommunications integrated circuit(s) cards and terminals - Part 5: Payment methods; German version EN 726-5:1999
Edition 2000-05

Electric components - Reliability - Reference conditions for failure rates and stress models for conversion (IEC 56/1583/CD:2014)
Edition 2015-01