Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022
Edition 2024-05

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022
Edition 2024-12

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017); German version EN 60749-28:2017
Edition 2018-02

Field device integration (FDI) - Part 100: Profiles - Generic protocols (IEC 62769-100:2020); English version EN IEC 62769-100:2020
Edition 2021-08

Field device integration (FDI) - Part 115-2: Profiles - Modbus-RTU (IEC 62769-115-2:2020); English version EN IEC 62769-115-2:2020
Edition 2022-09

Field device integration (FDI) - Part 150-1: Profiles - ISA100 WIRELESS (IEC 62769-150-1:2021); English version EN IEC 62769-150-1:2021
Edition 2022-11

Field Device Integration (FDI) - Part 4: FDI Packages (IEC 62769-4:2021); English version EN IEC 62769-4:2021
Edition 2022-09

Field device integration (FDI) - Part 103-4: Profiles - PROFINET (IEC 62769-103-4:2020); English version EN IEC 62769-103-4:2020
Edition 2021-03

Field device integration (FDI) - Part 103-1: Profiles - PROFIBUS (IEC 62769-103-1:2020); English version EN IEC 62769-103-1:2020
Edition 2021-03

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification (IEC 62575-1:2015); German version EN 62575-1:2016
Edition 2016-09