Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017); German version EN 60749-4:2017
Edition 2017-11

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV:2022); German and English version prEN IEC 60749-5:2022
Edition 2024-04

Dust emission of technical equipment - Evaluation of the emission of airborne hazardous substances - Part 2: Pollutant concentration parameter; stationary operated wood working machines
Edition 1997-11

Biological evaluation of medical devices - Part 18: Chemical characterization of medical device materials within a risk management process (ISO 10993-18:2020 + Amd 1:2022); German version EN ISO 10993-18:2020 + A1:2023
Edition 2023-11

Integrated circuits - Manufacturing line approval application guideline (IEC 61943:1999); German version EN 61943:1999
Edition 2001-10

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017
Edition 2017-11

Workplace exposure - Measurement of dustiness of bulk materials that contain or release respirable NOAA or other respirable particles - Part 5: Vortex shaker method; German version EN 17199-5:2019
Edition 2020-02

Gas analysis - Absolute volumetric method for dynamic preparation of calibration gases - Part 1: Preparation from pure gases, with CD-ROM
Edition 2014-05

Prosthetics - Structural testing of lower-limb prostheses - Requirements and test methods (ISO 10328:2016); German version EN ISO 10328:2016
Edition 2016-12

Safety of machinery - Positioning of safeguards with respect to the approach of the human body (ISO/DIS 13855:2022); German and English version prEN ISO 13855:2022
Edition 2022-04