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NF T36-030-3 ; NF EN ISO 16773-3:2016-06-04
Electrochemical impedance spectroscopy (EIS) on coated and uncoated metallic specimens - Part 3: processing and analysis of data from dummy cells
Edition
2016-06-04
NF T60-230 ; NF ISO 21033:2016-07-29
Animal and vegetable fats and oils - Determination of trace elements by inductively coupled plasma optical emission spectroscopy (ICP-OES)
Edition
2016-07-29
NF X21-013 ; NF ISO 11938:2012-05-01
Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
Edition
2012-05-01
NF C74-391 ; NF EN IEC 80601-2-71:2018-06-22
Medical electrical equipment - Part 2-71 : particular requirements for the basic safety and essential performance of functional near-infrared spectroscopy (NIRS) equipment
Edition
2018-06-22
NF M07-175 ; NF EN 18015:2024-07-24
Automotive fuels - Determination of hydrocarbon group types and select hydrocarbon and oxygenate compounds - Gas chromatography with vacuum ultraviolet absorption spectroscopy (GC-VUV) method
Edition
2024-07-24
OVE EN IEC 80601-2-71
Medical electrical equipment - Part 2-71: Particular requirements for the basic safety and essential performance of functional near-infrared spectroscopy (NIRS) equipment (IEC 62D/2062/CDV) (english version)
Edition
2023-10-01
23/30478019 DC
BS EN 18015. Automotive fuels. Determination of hydrocarbon group types and select hydrocarbon and oxygenate compounds. Gas chromatography with vacuum ultraviolet absorption spectroscopy (GC-VUV) method
Edition
2023-09-28
ISO/FDIS 16756 ; IDF 259:2024-07
Milk and milk products - Guidance for the application of Carr-Purcell-Meiboom-Gill (CPMG) pulsed time-domain nuclear magnetic resonance (TD-NMR) spectroscopy for fat determination
Edition
2024-07
BS EN ISO 16773-4
BS ENISO 16773-4 Paints and varnishes - Electrochemical impedance spectroscopy (EIS) on high-impedance coated specimens. Part 4: Examples of spectra of polymer-coated specimens
Edition
2017-07-11
BS ISO 17331+A1
Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
Edition
2005-03-31