Gunning Transceiver Logic (GTL) Low-Level, High Speed Interface Standard for Digital Integrated Circuits
Edition 2007-03

Center-Tap-Terminated (CTT) Low-Level, High- Speed Interface Standard for Digital Integrated Circuits
Edition 1993

Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM)
Edition 2017-11

Board Level Drop Test Method of Components for Handheld Electronic Products
Edition 2024-06

Board Level Cyclic Bend Test Method for Interconnect Reliability Characterization of SMT ICs for Handheld Electronic Products
Edition 2018-08

Procedure for the Wafer-Level Testing of Thin Dielectrics
Edition 2001-04

General Guidelines for Designing Test Structures for the Wafer-Level Testing of Thin Dielectrics
Edition 1995-09

Test Criteria for the Wafer-Level Testing of Thin Dielectrics
Edition 1996-02

Standard Test Loads For Dual - Supply Level Translation Devices
Edition 2005-11

Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
Edition 2015-12