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EIA-364-23E
TP-23E Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets
Edition
2024-08
EIA/TIA-526-27
OFSTP-27 Procedure for System-Level Temperature Cycle Endurance Test
Edition
1998-07
EIA-554 SET
Method Selection for Assessment of Nonconforming Levels in Parts per Million (PPM)
Edition
1996-08
EIA/ECA-961
QUALIFICATION SPECIFICATION FOR DIE LEVEL NETWORKS WITH SOLDER BUMP INTERCONNECTS
Edition
2005-11
EIA-60115-9-1
Fixed Resistors for Use in Electronic Equipment - Part 9-1: Blank Detail Specification: Fixed Surface Mount Resistor Networks with Individually Measurable Resistors - Assessment Level EZ
Edition
2014-10
EIA-60384-26-1
Fixed Capacitors for Use in Electronic Equipment - Part 26-1: Blank Detail Specification - Fixed Aluminium Electrolytic Capacitors with Conductive Polymer Solid Electrolyte - Assessment Level EZ
Edition
2014-09
EIA-60938-2-1
Fixed Inductors for Electromagnetic Interference Suppression - Part 2-1: Blank Detail Specification - Inductors for Which Safety Tests Are Required - Assessment Level D
Edition
2014-07
EIA JEP 001-2A
FOUNDRY PROCESS QUALIFICATION GUIDELINES - FRONT END TRANSISTOR LEVEL (Wafer Fabrication Manufacturing Sites)
Edition
2018-09
EIA JEP 001-3A
FOUNDRY PROCESS QUALIFICATION GUIDELINES - PRODUCT LEVEL (Wafer Fabrication Manufacturing Sites)
Edition
2018-09
EIA JEP 128
Guide for Standard Probe Pad Sizes and Layouts for Wafer-Level Electrical Testing
Edition
1996
