Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
Edition 2018-03

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Edition 2017-06

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Edition 2017-07

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Edition 2017-06

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Edition 2016-10

Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
Edition 2016-06

Semiconductor devices - Mechanical and climatic test methods. Part 24: Accelerated moisture resistance - Unbiased HAST
Edition 2004-04

Semiconductor devices - Mechanical and climatic test methods. Part 33: Accelerated moisture resistance - Unbiased autoclave
Edition 2004-04

Semiconductor devices - Mechanical and climatic test methods. Part 35: Acoustic microscopy for plastic encapsulated electronic components
Edition 2006-09

Semiconductor die products. Part 5: Requirements for information concerning electrical simulation
Edition 2006-09