Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022
Edition 2023-12

Home and Building Electronic Systems (HBES) - Part 6-2 IoT Semantic Ontology model description; German version EN 50090-6-2:2021
Edition 2023-06

Potentiometers for use in electronic equipment - Part 1: Generic specification (IEC 60393-1:2008); German version EN 60393-1:2009
Edition 2010-02

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2: Test methods for materials for interconnection structures (IEC 61189-2:2006); German version EN 61189-2:2006
Edition 2007-01

Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 21: List of Properties (LOP) of automated valves for electronic data exchange - Generic structures (IEC 61987-21:2015); German version EN 61987-21:2016
Edition 2016-07

Electroacoustics - Octave-band and fractional-octave-band filters - Part 3: Periodic tests (IEC 61260-3:2016); German version EN 61260-3:2016
Edition 2016-09

Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical (IEC 61988-2-1:2012); German version EN 61988-2-1:2012
Edition 2012-10

Hot rolled products of structural steels - Part 1: General technical delivery conditions; German version prEN 10025-1:2011
Edition 2011-04

Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 60122-4:2019); German version EN IEC 60122-4:2019
Edition 2019-10

Fibre optic active components and devices - Test and measurement procedures - Part 5: Wavelength channel tuning time of tuneable transmitters (IEC 62150-5:2017); German version EN 62150-5:2017
Edition 2018-04