Fibre optic interconnecting devices and passive components - Adaptors for fibre optic connectors - Part 1-1: Blank detail specification (IEC 61274-1-1:2011); German version EN 61274-1-1:2012
Edition 2012-10

Aerospace series - Cables, electric, general purpose, with conductors in aluminium or copper-clad aluminium - Part 006: AZA family, single and multicore assembly, for use in low pressure atmosphere - Product standard; German and English version EN 4681-006:2019
Edition 2019-11

Aerospace series - Cables, electric, general purpose, with conductors in aluminium or copper-clad aluminium - Part 005: AZ family, single, for use in low pressure atmosphere - Product standard; German and English version EN 4681-005:2019
Edition 2019-11

Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-37: Tests - Cable bending for fibre optic closures (IEC 61300-2-37:2016); German version EN 61300-2-37:2016
Edition 2017-02

Fibre optic interconnecting devices and passive components - Performance standard - Part 052-6: Single-mode fibre non-connectorized fixed attenuator - Category O in outside plant environment (IEC 61753-052-6:2016); German version EN 61753-052-6:2016
Edition 2017-07

Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-1: Tests - Vibration (sinusoidal) (IEC 61300-2-1:2023); German version EN IEC 61300-2-1:2023
Edition 2024-01

Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-11: Tests - Axial compression (IEC 61300-2-11:2023); German version EN IEC 61300-2-11:2024
Edition 2024-09

Optical fibre cables - Part 1-312: Generic specification - Basic optical cable test procedures - Cable element test methods - Elongation test for buffer tubes at low temperature, Method G11B (IEC 60794-1-312:2024); German version EN IEC 60794-1-312:2024
Edition 2024-07

Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-2: Tests - Mating durability, (IEC 61300-2-2:2009); German version EN 61300-2-2:2009 + Corrigendum:2009
Edition 2009-09

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
Edition 2010-12