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Standards [CURRENT]

DIN 18009-2

Fire safety engineering - Part 2: Simulation of evacuation and personal safety
Edition 2022-08

Standards [CURRENT]

DIN IEC 60115-7-1

Fixed resistors for use in electronic equipment; blank detail specification; fixed resistor networks in which not all resistors are individually measurable; assessment level E; identical with IEC 60115-7-1:1984
Edition 1989-08

Standards [CURRENT]

DIN IEC 60068-2-46

Electrical ingeneering; basic environmental testing procedures; tests; guidance to test Kd: hydrogen sulphide H₂S (high concentration) for electrical contacts and connections; identical with IEC 60068-2-46, edition 1982
Edition 1985-08

Standards [CURRENT]

DIN IEC 60068-2-49

Electrical engineering; basic environmental testing procedures; guidance to test Kc: sulphur dioxide SO₂ (high concentration) for electrical contacts and connections; indentical with IEC 68-2-49, edition 1983
Edition 1985-08

Standards [CURRENT]

DIN IEC 60115-4-1

Fixed resistors for use in electronic equipment; blank detail specification: fixed power resistors; assessment level E; identical with IEC 60115-4-1, edition 1983
Edition 1987-04

Standards [CURRENT]

DIN EN 62047-4

Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 62047-4:2008); German version EN 62047-4:2010
Edition 2011-03

Standards [CURRENT]

DIN EN 62047-2

Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006); German version EN 62047-2:2006
Edition 2007-02

Standards [CURRENT]

DIN EN 60297-3-101

Mechanical structures for electronic equipment - Dimensions of mechanical structures of the 482,6 mm (19 in) series - Part 3-101: Subracks and associated plug-in units (IEC 60297-3-101:2004); German version EN 60297-3-101:2004
Edition 2005-06

Standards [CURRENT]

DIN EN 62298-1

Teleweb application - Part 1: General description (IEC 62298-1:2005); German version EN 62298-1:2005
Edition 2005-11

Standards [CURRENT]

DIN EN 60749-8

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing (IEC 60749-8:2002 + Corr. 1:2003 + Corr. 2:2003); German version EN 60749-8:2003
Edition 2003-12

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