Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in August of 2017.)
Edition 2017-08-01

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (Endorsed by AENOR in July of 2008.)
Edition 2008-07-01

Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.)
Edition 2011-11-01

Fixed inductors for electromagnetic interference suppression - Part 2-1: Blank detail specification - Inductors for which safety tests are required - Assessment level D (Endorsed by AENOR in June of 2000.)
Edition 2000-06-01

Complete filter units for radio interference suppression - Part 2-1: Blank detail specification - Passive filter units for electromagnetic interference suppression - Filters for which safety tests are required (assessment level D/DZ) (Endorsed by AENOR in April of 2005.)
Edition 2005-04-01

Aircraft batteries - Part 1: General test requirements and performance levels (Endorsed by AENOR in November of 2013.)
Edition 2013-11-01

Electromagnetic compatibility (EMC) - Part 2-2: Environment - Compatibility levels for low-frequency conducted disturbances and signalling in public low-voltage power supply systems
Edition 2003-07-30

Electromagnetic compatibility (EMC) - Part 2-2: Environment - Compatibility levels for low-frequency conducted disturbances and signalling in public low-voltage power supply systems
Edition 2018-03-28

Electromagnetic compatibility (EMC) - Environment - Compatibility levels for low-frequency conducted disturbances and signalling in public low-voltage power supply systems
Edition 2020-01-15

Electromagnetic compatibility (EMC) - Part 2-4: Environment - Compatibility levels in industrial plants for low-frequency conducted disturbances
Edition 2004-05-14