Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Measurement of conducted emissions - Workbench Faraday Cage method
Edition 2003-06-17

Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL-SCHOTTKY circuits, series 54S, 64S, 74S, 84S
Edition 1990-07-15

Harmonized system of quality assessment for electronic components. Sectional specification: fixed inductors with ceramic or ferrite core wound with copper wire for RF circuits
Edition 1996-02-15

Specification for harmonized system of quality assessment for electronic components. Family specification: C. Mos digital integrated circuits, series 4000B and 4000UB
Edition 1981-11-15

Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS
Edition 1983-01-15

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits (capability approval)
Edition 1985-06-15

Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits, series 54, 64, 74, 84
Edition 1980-04-15

Specification for harmonized system of quality assessment for electronic components. Family specification. Digital integrated HC MOS circuits series HC/HCT/HCU
Edition 1986-11-15

Specification for control and interlock circuits primarily associated with flameproof restrained plugs and sockets for use in coal mines
Edition 1986-12-31

Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits
Edition 1987-05-15