Search results
Search list
Results in:
ISO 14807
Photography - Transmission and reflection densitometers - Method for determining performance
Edition
2001-10
ISO 15368
Optics and photonics - Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
Edition
2021-03
ISO 17331
Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
Edition
2004-05
ISO 17331 AMD 1
Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy; Amendment 1
Edition
2010-07
ISO 17502 ; IULTCS/IUF 472:2013-05
Leather - Determination of surface reflectance
Edition
2013-05
ISO/TS 18507
Surface chemical analysis - Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
Edition
2015-07
ISO 20083-2
Ships and marine technology - Determination of the shaft power of ship propulsion systems by measuring the shaft distorsion - Part 2: Optical reflection method
Edition
2019-06
ISO/TR 20278
Unwanted reflections from the active and inactive areas of display surfaces visible during use
Edition
2015-12
ISO/DIS 20289
Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
Edition
2024-07
ISO 20289
Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
Edition
2018-03