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Method for the determination of the proof and the comparative tracking indices of solid insulating materials (IEC 60112:2020); German version EN IEC 60112:2020
Edition 2022-11

Standards [CURRENT]

DIN EN 60404-15

Magnetic materials - Part 15: Methods for the determination of the relative magnetic permeability of feebly magnetic materials (IEC 60404-15:2012 + A1:2016); German version EN 60404-15:2012 + A1:2017
Edition 2018-03

Electric and optical fibre cables - Test methods for non-metallic materials - Part 603: Physical tests - Measurement of total acid number of filling compounds (IEC 60811-603:2012); German version EN 60811-603:2012
Edition 2012-12

Standards [CURRENT]

DIN EN 60835-3-7

Methods of measurement for digital microwave transmission systems - Part 3: Measurements on satellite earth stations; section 7: Figure-of-merit of receiving system (IEC 60835-3-7:1995); German version EN 60835-3-7:1995
Edition 1996-02

Standards [CURRENT]

DIN EN 61290-3

Optical amplifiers - Test methods - Part 3: Noise figure parameters (IEC 61290-3:2008); German version EN 61290-3:2008
Edition 2009-03

Standards [CURRENT]

DIN EN 61290-3-1

Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
Edition 2004-05

Standards [CURRENT]

DIN EN 61290-3-2

Optical amplifier - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008); German version EN 61290-3-2:2008
Edition 2009-06

Standards [CURRENT]

DIN EN 61290-3-3

Optical amplifiers - Test methods - Part 3-3: Noise figure parameters - Signal power to total ASE power ratio (IEC 61290-3-3:2013); German version EN 61290-3-3:2014
Edition 2014-11

Standards [CURRENT]

DIN EN 61290-10-5

Optical amplifiers - Test methods - Part 10-5: Multichannel parameters - Distributed Raman amplifier gain and noise figure (IEC 61290-10-5:2014); German version EN 61290-10-5:2014
Edition 2015-03

Standards [CURRENT]

DIN EN 62047-21

Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials (IEC 62047-21:2014); German version EN 62047-21:2014
Edition 2015-04

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