Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
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Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
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Edition 2024-05-15

Chemical analysis of raw materials and refractory products containing silicon-carbide, silicon-nitride, silicon-oxynitride and sialon - Part 2: determination of volatile components, total carbon, free carbon, silicon carbide, total and free silicon, free and surface silica
Edition 2024-06-19

Chemical analysis of raw materials and refractory products containing silicon-carbide, silicon-nitride, silicon-oxynitride and sialon - Part 3: determination of nitrogen, oxygen and metallic and oxidic constituents
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Chemical analysis of raw materials and refractory products containing silicon-carbide, silicon-nitride, silicon-oxynitride and sialon - Part 4: XRD methods
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Abrasive grains and crude - Chemical analysis of silicon carbide
Edition 2021-12-17

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)