Semiconductor devices - Micro-electromechanical devices - Part 12: bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Edition 2012-07-01

Electromagnetic compatibility (EMC) - Part 4-4 : testing and measurement techniques - Electrical fast transient/burst immunity test
Edition 2013-02-28

Semiconductor devices - Mechanical and climatic test methods - Part 27: electrostatic discharge (ESD) sensivity testing - Machine model (MM)
Edition 2013-03-20

Mechanical structures for electronic equipment - Tests for IEC 60917 and IEC 60297 - Part 3: electromagnetic shielding performance tests for cabinets and subracks
Edition 2013-08-17

Electromagnetic compatibility (EMC) - Part 4-6 : testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
Edition 2014-05-16

Semiconductor devices - Micro-electromechanical devices - Part 21: test method for Poisson's ratio of thin film MEMS materials
Edition 2014-12-26

Electroacoustics - Simulators of human head and ear - Part 3: acoustic coupler for the calibration of supra-aural earphones used in audiometry
Edition 2015-04-18

Electroacoustics - Audio-frequency induction loop systems for assisted hearing - Part 1: methods of measuring and specifying the performance of system components
Edition 2015-04-04

Semiconductor devices - Micro-electromechanical devices - Part 16: test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods
Edition 2015-11-14

Determination of certain substances in electrotechnical products - Part 6: polybrominated biphenyls and polybrominated diphenyl ethers in polymers by gas chromatography-mass spectrometry (GC-MS)
Edition 2015-10-30