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DIN 50452-3
Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 3: Calibration of optical particle counters
Edition
1995-10
DIN 50453-1
Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 1: Silicium monocrystals, gravimetric method
Edition
2023-08
DIN 50453-2
Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 2: Silicon-dioxide coating, optical method
Edition
2023-08
DIN 50455-1
Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods
Edition
2009-10
DIN 50455-2
Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists
Edition
1999-11
DIN 50460
Determination of magnetic properties of soft magnetic materials; general, terminology and principles of measurement
Edition
1988-08
DIN 50508
Chemical analysis of copper and copper alloys; determination of tin as alloying element, volumetric method
Edition
1977-06
DIN 50510
Chemical analysis of copper and copper alloys; determination of arsenic in copper and copper alloys, photometric method
Edition
1980-04
DIN 50934-1
Corrosion of metals - Methods for evaluation of efficiency of water treatment apparatuses for corrosion protection - Part 1: General
Edition
2024-07
DIN 50934-1
Corrosion of metals - Methods for evaluation of efficiency of water treatment apparatus for corrosion protection - Part 1: General
Edition
2000-04