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OENORM EN ISO 6428
Technical drawings - Requirements for microcopying (ISO 6428:1982)
Edition
1999-11-01
OENORM EN ISO 10893-6
Non-destructive testing of steel tubes - Part 6: Radiographic testing of the weld seam of welded steel tubes for the detection of imperfections (ISO 10893-6:2019)
Edition
2019-07-15
OENORM EN ISO 10893-7
Non-destructive testing of steel tubes - Part 7: Digital radiographic testing of the weld seam of welded steel tubes for the detection of imperfections (ISO 10893-7:2019)
Edition
2019-07-15
OEVE/OENORM EN 62047-16
Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods (IEC 62047-16:2015) (german version)
Edition
2016-02-01
OEVE/OENORM EN 60454-3-1+A1
Pressure-sensitive adhesive tapes for electrical purposes - Part 3: Specifications for individual materials - Sheet 1: PVC film tapes with pressure-sensitive adhesive (IEC 60454-3-1:1998 + A1:2001)
Edition
2002-05-01
OEVE/OENORM EN 60454-3-14
Pressure-sensitive adhesive tapes for electrical purposes - Part 3: Specifications for individual materials - Sheet 14: Polytetrafluoroethylene film tapes with pressure-sensitive adhesive (IEC 60454-3-14:2001)
Edition
2002-05-01
SN EN 60454-3-1+A1
Pressure-sensitive adhesive tapes for electrical purposes. Part 3-1: Specifications for individual materials - PVC film tapes with pressure-sensitive adhesive
Edition
2001-07
OEVE EN 60454-3-10
Pressure-sensitive adhesive tapes for electrical purposes - Part 3: Specifications for individual materials - Sheet 10: Requirements for cellulose-acetate-butyrate ...(abbreviated)
Edition
1996-03-10
OENORM EN ISO 3233-3
Paints and varnishes - Determination of the percentage volume of non-volatile matter - Part 3: Determination by calculation from the non-volatile-matter content determined in accordance with ISO 3251, the density of the coating material and the density of the solvent in the coating material (ISO 3233-3:2015)
Edition
2015-08-15
OVE EN 62047-26
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures (IEC 62047-26:2016) (german version)
Edition
2017-01-01
