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EIA JESD 300-5B.01
SPD5118 Hub and Serial Presence Detect Device Standard
Edition
2023-05
BS IEC 60748-2-11
Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory. Blank detail specification for single supply integrated circuits electrically erasible and programmable read-only memory
Edition
1999-08-15
OVE EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices ((IEC 60749-41:2020) EN IEC 60749-41:2020) (german version)
Edition
2023-04-01
SN EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Edition
2020-09
UNE-EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (Endorsed by Asociación Española de Normalización in October of 2020.)
Edition
2020-10-01
BS EN IEC 60749-41
Semiconductor devices. Mechanical and climatic test methods. Standard reliability testing methods of non-volatile memory devices
Edition
2020-09-09
NF C96-022-41 ; NF EN IEC 60749-41:2020-09-04
Semiconductor devices - Mechanical and climatic test methods - Part 41: standard reliability testing methods of non-volatile memory devices
Edition
2020-09-04
VDI 4416
Production data acquisition and identification - Identification systems
Edition
2015-05
VDI 4416
Production data acquisition - Identification systems
Edition
1998-11
VDI 3805 Blatt 50
Product data exchange in the building services - Automation equipment for building automation and control systems (BACS)
Edition
2024-10
