Production equipment for microsystems - Determination of the influence of materials on the optical and tactile dimensional metrology - Part 5: Derivation of correction values for optical measuring devices
Edition 2015-06

Information and documentation - Requirements for binding of library, archive and other paper documents for archive and library use - Methods and materials
Edition 2004-11

Classification of switches according to connections
Edition 1961-03

Electrical installation material - Plugs and socket-outlets for household and industrial use - Synopsis
Edition 1999-06

Adhesive bondings in electronic applications - Determination of thermal conductivity of materials for heat dissipation
Edition 2024-06

Terms and definitions used on ageing of materials - Polymeric materials
Edition 2012-09

Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell
Edition 1987-08

Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N₂, Ar, He, Ne and H₂ by using a galvanic cell
Edition 1991-03

Testing of materials for semiconductor technology; determination of impurities in carrier gases and dopant gases; determination of C₁-C₃-hydrocarbons in nitrogen by gas-chromatography
Edition 1993-09

Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonoxide, carbondioxide, hydrogen and C₁-C₃-hydrocarbons in gaseous hydrogen chloride by gaschromatography
Edition 2021-07