Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) (IEC 60749-14:2003); German version EN 60749-14:2003
Edition 2004-07

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006 + A1:2012); German version EN 60749-27:2006 + A1:2012
Edition 2013-04

Health and safety in welding and allied processes - Sampling of airborne particles and gases in the operator's breathing zone - Part 1: Sampling of airborne particles (ISO/DIS 10882-1:2023); German and English version prEN ISO 10882-1:2023
Edition 2023-06

Transportation loads - Measurement and evaluation of dynamic mechanical loads - Part 5: Derivation of test specifications; German version EN 15433-5:2007
Edition 2008-02

Space engineering - Explosive subsystems and devices; English version EN 16603-33-11:2019
Edition 2019-09

Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010
Edition 2010-12

Cleanliness of medical devices - Risk orientated validation of cleanliness, development of acceptance criteria and selection of test methods; Text in German and English
Edition 2022-04

Fibre optic interconnecting devices and passive components - Performance standard - Part 081-06: Non-connectorized single-mode fibre optic middle-scale 1 x N DWDM devices for category OP+ - Extended outdoor protected environment (IEC 86B/4398/CD:2020); Text in German and English
Edition 2022-10

Transmission and Multiplexing (TM) - Optical Distribution Network (ODN) for Optical Access Network (OAN); English version ETS 300681:1997
Edition 1998-05

Space engineering - Interface management; English version EN 16603-10-24:2017
Edition 2017-11