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Standards [CURRENT]

DIN 15584-1

Digital cinema - Image Projection - Part 1: Image geometries, their tolerances and test patterns
Edition 2019-09

Standards [CURRENT]

DIN 22252

Round steel link chains for use in continuous conveyors and winning equipment in mining
Edition 2012-07

Standards [CURRENT]

DIN 22129-3

Steelcord conveyor belts for underground coalmining; testing
Edition 1988-02

Standards [CURRENT]

DIN EN 12240

Touch and close fasteners - Determination of the overall and effective widths of tapes and the effective width of a closure; German version EN 12240:1997
Edition 1997-08

Standards [CURRENT]

DIN EN 131700

Sectional specification: Fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric; German version EN 131700:1997
Edition 1998-10

Standards [CURRENT]

DIN EN 62047-16

Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods (IEC 62047-16:2015); German version EN 62047-16:2015
Edition 2015-12

Standards [CURRENT]

DIN EN 60191-6-20

Mechanical standardization of semiconductor devices - Part 6-20: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline J-lead packages (SOJ) (IEC 60191-6-20:2010); German version EN 60191-6-20:2010
Edition 2011-03

Standards [CURRENT]

DIN EN 60191-6-21

Mechanical standardization of semiconductor devices - Part 6-21: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline packages (SOP) (IEC 60191-6-21:2010); German version EN 60191-6-21:2010
Edition 2011-03

Standards [CURRENT]

DIN EN 62490-2

ESL measuring method - Part 2: Surface mount capacitors for use in electronic equipment (IEC 62490-2:2010); German version EN 62490-2:2010
Edition 2011-04

Standards [CURRENT]

DIN EN 61290-11-1

Optical amplifiers - Test methods - Part 11-1: Polarization mode dispersion parameter - Jones matrix eigenanalysis (JME) (IEC 61290-11-1:2008); German version EN 61290-11-1:2008
Edition 2009-02

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