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OVE EN IEC 60749-26
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge ESD sensitivity testing - Human body model HBM IEC 60749-26:2018 german version
Edition
2018-12-01
OVE EN IEC 60749-28
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 47/2661/CDV) (english version)
Edition
2021-01-01
OVE EN 60749-28
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017) (german version)
Edition
2018-03-01
OVE EN 60904-8-1
Photovoltaic devices - Part 8-1: Measurement of spectral responsivity of multi-junction photovoltaic (PV) devices (IEC 60904-8-1:2017) (german version)
Edition
2018-06-01
OVE EN 61853-2
Photovoltaic (PV) module performance testing and energy rating - Part 2: Spectral responsivity, incidence angle and module operating temperature measurements ( IEC 61853-2:2016) (german version)
Edition
2017-06-01
SN EN IEC 60749-26
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Edition
2018-03
SN EN 16140 ; SIA 246.224:2019-01
Natural stone test methods - Determination of sensitivity to changes in appearance produced by thermal cycles
Edition
2019-01
SN EN 16301 ; SIA 246.226:2021-03
Natural stone test methods - Determination of sensitivity to accidental staining
Edition
2021-03
SN EN 60749-27
Semiconductor devices - Mechanical and climatic test methods. Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Edition
2006-08
SN EN 60749-27+A1
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Edition
2012-11