Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)
Edition 2010-09-01

Semiconductor devices - Discrete devices - Insulated-gate bipolar transistors (IGBTs)
Edition 2019-11-22

Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Test method for bias temperature instability
Edition 2022-10-05

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Edition 2020

Nanomanufacturing. Key control characteristics. Two-dimensional materials. Carrier concentration: Field effect transistor method
Edition 2022-11-29

Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Edition 2010-06-30

Printed electronics. Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Edition 2021-09-08

Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET). Fast BTI test for MOSFET
Edition 2023-03-30

Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications
Edition 1996-12-15

BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET). Part 1. Fast BTI Test method
Edition 2017-11-30