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Standards [CURRENT]

ISO 21909-2

Passive neutron dosimetry systems - Part 2: Methodology and criteria for the qualification of personal dosimetry systems in workplaces
Edition 2021-12

Standards [CURRENT]

ISO 23018

Group-averaged neutron and gamma-ray cross sections for radiation protection and shielding calculations for nuclear reactors
Edition 2022-05

Standards [CURRENT]

OENORM EN ISO 8529-1

Neutron reference radiations fields - Part 1: Characteristics and methods of production (ISO 8529-1:2021)
Edition 2024-02-15

Draft standard

OENORM EN ISO 8529-3

Neutron reference radiation fields - Part 3: Calibration of area and personal dosemeters and determination of their response as a function of neutron energy and angle of incidence (ISO 8529-3:2023, including corrected version 2023-09)
Edition 2024-04-01

Standards [CURRENT]

OENORM EN ISO 21432

Non-destructive testing - Standard test method for determining residual stresses by neutron diffraction (ISO 21432:2019)
Edition 2021-03-15

Standards [CURRENT]

OENORM EN ISO 21909-1

Passive neutron dosimetry systems - Part 1: Performance and test requirements for personal dosimetry (ISO 21909-1:2021)
Edition 2024-02-15

Standards [CURRENT]

OENORM EN ISO 21909-2

Passive neutron dosimetry systems - Part 2: Methodology and criteria for the qualification of personal dosimetry systems in workplaces (ISO 21909-2:2021)
Edition 2024-02-15

Standards [CURRENT]

OEVE/OENORM EN 61526

Radiation protection instrumentation - Measurement of personal dose equivalents Hp(10) and Hp(0,07) for X, gamma, neutron and beta radiations - Direct reading personal dose equivalent meters (IEC 61526:2010, modified) (german version)
Edition 2013-11-01

Standards [CURRENT]

OVE EN IEC 60749-17

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 60749-17:2019) (german version)
Edition 2019-12-01

Standards [CURRENT]

OVE EN 60749-44

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices ( IEC 60749-44:2016) (german version)
Edition 2017-05-01

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