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BS EN IEC 61788-7
Superconductivity. Electronic characteristic measurements. Surface resistance of high-temperature superconductors at microwave frequencies
Edition
2020-05-20
PD IEC/TS 61994-4-4
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary. Piezoelectric materials. Single crystal wafers for surface acoustic wave (SAW) devices
Edition
2018-11-22
BS EN 60749-29
Semiconductor devices. Mechanical and climatic test methods. Latch-up test
Edition
2011-08-31
ABNT NBR IEC 60749-29
Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
Edition
2011-03-02
BS EN 60444-9
Measurement of quartz crystal unit parameters - Measurement of spurious resonances of piezoelectric crystal units
Edition
2007-05-31
NF C96-022-29 ; NF EN 60749-29:2012-08-01
Semiconductor devices - Mechanical and climatic test methods - Part 29: latch-up test
Edition
2012-08-01
NF C93-604-1 ; NF EN 62604-1:2015-11-28
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: generic specification
Edition
2015-11-28
NF C93-617-1 ; NF EN 62575-1:2016-04-23
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: generic specification
Edition
2016-04-23
BS EN ISO 11145
Optics and photonics. Lasers and laser-related equipment. Vocabulary and symbols
Edition
2018-12-19
NF C93-604-1 ; NF EN IEC 62604-1:2022-09-02
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
Edition
2022-09-02
