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SN EN 62047-21
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Edition
2014-09
SN EN 62047-22
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
Edition
2014-09
SN EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Edition
2006-08
SN EN 62047-13
Semiconductor devices - Microelectromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strenght for MEMS structures
Edition
2012-04
SN EN 60747-16-10
Semiconductor devices. Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
Edition
2004-09
SN EN 60269-4
Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
Edition
2009-11
SN EN 60947-4-2
Low-voltage switchgear and controlgear - Part 4-2: Contactors and motor-starters - AC semiconductor motor controllers and starters
Edition
2012-06
EIA JEP 195
Guideline for Evaluating Gate Switching Instability of Silicon Carbide Metal-Oxide-Semiconductor Devices for Power Electronic Conversion
Edition
2023-02
EIA JEP 151A
Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
Edition
2022-01
EIA JEP 184
Guideline for evaluating Bias Temperature Instability of Silicon Carbide Metal-Oxide-Semiconductor Devices for Power Electronic Conversion
Edition
2021-03
