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EIA JEP 78
Relative Spectral Response Curves for Semiconductor Infrared Detectors
Edition
1969
EIA CB-5
Recommended Test Procedure for Semiconductor Thermal Dissipating Devices
Edition
1969-07
EIA JEP 140
Beaded Thermocouple Temperature Measurement of Semiconductor Packages
Edition
2002-06
EIA JEP 104C.01
Reference Guide to Letter Symbols for Semiconductor Devices
Edition
2003-05
SN EN 60191-6-22
Mechanical Standardization Of Semiconductor Devices - Part 6-22: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for semiconductor packages Silicon Fine-pitch Ball Grid Array andSili
Edition
2013-03
EIA JEP 134
Guidelines for Preparing Customer-Supplied Background Information Relating to a Semiconductor-Device Failure Analysis
Edition
1998-09
SN EN 62007-2
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
Edition
2009-03
SN EN IEC 60749-37
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Edition
2022-11
SN EN IEC 60749-10
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
Edition
2022-06
SN EN IEC 62435-9
Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases
Edition
2021-10
