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PR NF M60-705 ; PR NF EN 17216
Construction products: Assessment of release of dangerous substances - Determination of activity of radium-226, thorium-232 and potassium-40 in construction products using semiconductor gamma-ray spectrometry
PR NF C96-022-20-1 ; PR NF EN IEC 60749-20-1
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
PR NF C63-112/A1 ; PR NF EN IEC 60947-4-2/A1
Amendment 1 - Low-voltage switchgear and controlgear - Part 4-2 : contactors and motor-starters - Semiconductor motor controllers, starters and soft-starters
EIA JEP 167A
Characterization of Interfacial Adhesion in Semiconductor Packages
Edition
2020-11
EIA JEP 122H
Failure Mechanisms and Models for Semiconductor Devices
Edition
2016-09
EIA CB-5-1
Recommended Test Procedure for Semiconductor Thermal Dissipating Devices
Edition
1971-05
EIA JEB 15
Terminology and Methods of Measurement for Bistable Semiconductor Microcircuits
Edition
1969
EIA JEP 78
Relative Spectral Response Curves for Semiconductor Infrared Detectors
Edition
1969
EIA CB-5
Recommended Test Procedure for Semiconductor Thermal Dissipating Devices
Edition
1969-07
EIA JEP 140
Beaded Thermocouple Temperature Measurement of Semiconductor Packages
Edition
2002-06
