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NF C96-050-14 ; NF EN 62047-14:2012-12-01
Semiconductor devices - Micro-electromechanical devices - Part 14: forming limit measuring method of metallic film materials
Edition
2012-12-01
NF C96-435-7 ; NF EN IEC 62435-7:2021-01-22
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: micro-electromechanical devices
Edition
2021-01-22
NF C96-051 ; NF EN 62373:2006-10-01
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Edition
2006-10-01
NF C96-050-3 ; NF EN 62047-3:2006-11-01
Semiconductor devices - Micro-electromechanical devices - Part 3: thin film standard test piece for tensile testing
Edition
2006-11-01
NF C31-888-6 ; NF EN 61788-6:2012-06-01
Superconductivity - Part 6: mechanical properties measurement - Room temperature tensile test of Cu/Nb-Ti composite superconductors
Edition
2012-06-01
NF C96-050-12 ; NF EN 62047-12:2012-07-01
Semiconductor devices - Micro-electromechanical devices - Part 12: bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Edition
2012-07-01
NF C96-022-27/A1 ; NF EN 60749-27/A1:2013-03-20
Semiconductor devices - Mechanical and climatic test methods - Part 27: electrostatic discharge (ESD) sensivity testing - Machine model (MM)
Edition
2013-03-20
NF C31-888-12 ; NF EN 61788-12:2014-05-02
Superconductivity - Part 12: matrix to superconductor volume ratio measurement - Copper to non-copper volume ratio of Nb3Sn composite superconducting wires
Edition
2014-05-02
NF C96-050-22 ; NF EN 62047-22:2014-12-26
Semiconductor devices - Micro-electromechanical devices - Part 22: electromechanical tensile test method for conductive thin films on flexible substrates
Edition
2014-12-26
NF C96-050-21 ; NF EN 62047-21:2014-12-26
Semiconductor devices - Micro-electromechanical devices - Part 21: test method for Poisson's ratio of thin film MEMS materials
Edition
2014-12-26
