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NF C96-051 ; NF EN 62373:2006-10-01
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Edition
2006-10-01
NF C96-050-3 ; NF EN 62047-3:2006-11-01
Semiconductor devices - Micro-electromechanical devices - Part 3: thin film standard test piece for tensile testing
Edition
2006-11-01
NF C96-050-6 ; NF EN 62047-6:2010-09-01
Semiconductor devices - Micro-electromechanical devices - Part 6: axial fatigue testing methods of thin film materials
Edition
2010-09-01
NF C96-013-6-19 ; NF EN 60191-6-19:2010-11-01
Mechanical standardization of semiconductor devices - Part 6-19 : measurement methods of package warpage at elevated temperature and the maximum permissible warpage
Edition
2010-11-01
NF C96-050-26 ; NF EN 62047-26:2016-06-25
Semiconductor devices - Micro-electromechanical devices - Part 26: description and measurement methods for micro trench and needle structures
Edition
2016-06-25
NF C96-022-32/A1 ; NF EN 60749-32/A1:2011-05-01
Semiconductor devices - Mechanical and climatic test methods - Part 32: flammability of plastic-encapsulated devices (externally induced)
Edition
2011-05-01
NF C96-017-1 ; NF EN 62374-1:2011-06-01
Semiconductor devices - Part 1: time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Edition
2011-06-01
NF C53-211 ; NF EN 60146-1-1:2011-04-01
Semiconductor converters - General requirements and line commutated converters - Part 1-1 : specification of basic requirements
Edition
2011-04-01
NF C96-050-8 ; NF EN 62047-8:2011-10-01
Semiconductor devices - Micro-electromechanical devices - Part 8: strip bending test method for tensile property measurement of thin films
Edition
2011-10-01
NF C96-050-7 ; NF EN 62047-7:2011-12-01
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Edition
2011-12-01
