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Standards [CURRENT]

OEVE/OENORM EN 60318-3

Electroacoustics - Simulators of human head and ear - Part 3: Acoustic coupler for the calibration of supra-aural earphones used in audiometry (IEC 60318-3:2014) (german version)
Edition 2015-11-01

Standards [CURRENT]

OENORM EN ISO 17201-5

Acoustics - Noise from shooting ranges - Part 5: Noise management (ISO 17201-5:2010)
Edition 2010-06-15

Standards [CURRENT]

OENORM EN 15944

Liquid petroleum products - Determination of nickel and vanadium content - Inductively coupled plasma optical emission spectrometry method (ICP OES)
Edition 2011-01-01

Standards [CURRENT]

OENORM EN ISO 9241-129

Ergonomics of human-system interaction - Part 129: Guidance on software individualization (ISO 9241-129:2010)
Edition 2011-02-15

Standards [CURRENT]

OENORM EN ISO 3744

Acoustics - Determination of sound power levels and sound energy levels of noise sources using sound pressure - Engineering methods for an essentially free field over a reflecting plane (ISO 3744:2010)
Edition 2011-03-01

Standards [CURRENT]

OENORM EN ISO 3746

Acoustics - Determination of sound power levels and sound energy levels of noise sources using sound pressure - Survey method using an enveloping measurement surface over a reflecting plane (ISO 3746:2010)
Edition 2011-03-01

Standards [CURRENT]

OENORM EN 1147

Portable ladders for fire service use
Edition 2012-06-15

Standards [CURRENT]

OENORM EN ISO 14982

Agricultural and forestry machinery - Electromagnetic compatibility - Test methods and acceptance criteria (ISO 14982:1998)
Edition 2010-01-01

Standards [CURRENT]

OEVE/OENORM EN 62058-21

Electricity metering equipment (a.c.) - Acceptance inspection - Part 21: Particular requirements for electromechanical meters for active energy (classes 0,5, 1 and 2 and class indexes A and B) (IEC 62058-21:2008, modified)
Edition 2011-05-01

Standards [CURRENT]

OEVE/OENORM EN 60191-6-20

Mechanical standardization of semiconductor devices - Part 6-20: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline J-lead packages (SOJ) (IEC 60191-6-20:2010)
Edition 2011-05-01

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