Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002)
Edition 2003-10-01

Electric and optical fibre cables - Test methods for non-metallic materials - Part 504: Mechanical tests - Bending tests at low temperature for insulation and sheaths (IEC 60811-504:2012) (german version)
Edition 2013-01-01

Electric and optical fibre cables - Test methods for non-metallic materials - Part 505: Mechanical tests - Elongation at low temperature for insulations and sheaths (IEC 60811-505:2012) (german version)
Edition 2013-01-01

Electric and optical fibre cables - Test methods for non-metallic materials - Part 506: Mechanical tests - Impact test at low temperature for insulations and sheaths (IEC 60811-506:2012) (german version)
Edition 2013-01-01

Mineral insulating oils - Determination of kinematic viscosity at very low temperatures (IEC 61868:1998)
Edition 2000-01-01

Exposure to electric or magnetic fields in the low and intermediate frequency range - Methods for calculating the current density and internal electric field induced in the human body - Part 1: General (IEC 62226-1:2004)
Edition 2006-01-01

Exposure to electric or magnetic fields in the low and intermediate frequency range - Methods for calculating the current density and internal electric field induced in the human body - Part 2-1: Exposure to magnetic fields - 2D models (IEC 62226-2-1:2004)
Edition 2005-11-01

Blank Detail Specification: Fixed low power film resistors
Edition 2008-10-01

Detail Specification: Fixed low power film resistors - Metal film resistors on high grade ceramic, conformal coated or molded, axial or preformed leads (german version)
Edition 2014-11-01

Blank Detail Specification: Fixed low power film surface mount (SMD) resistors (german version)
Edition 2012-10-01