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DIN EN 61290-10-5
Optical amplifiers - Test methods - Part 10-5: Multichannel parameters - Distributed Raman amplifier gain and noise figure (IEC 61290-10-5:2014); German version EN 61290-10-5:2014
Edition
2015-03
DIN EN IEC 60539-2
Directly heated negative temperature coefficient thermistors - Part 2: Sectional specification - Surface mount negative temperature coefficient thermistors (IEC 60539-2:2019); German version EN IEC 60539-2:2019
Edition
2020-12
DIN EN IEC 62343-5-2
Dynamic modules - Part 5-2: Test methods - 1×N fixed-grid WSS - Dynamic crosstalk measurement (IEC 62343-5-2:2018); German version EN IEC 62343-5-2:2018
Edition
2019-01
DIN EN IEC 61290-4-3
Optical amplifiers - Test methods - Part 4-3: Power transient parameters - Single channel optical amplifiers in output power control (IEC 61290-4-3:2018); German version EN IEC 61290-4-3:2018
Edition
2019-12
DIN EN 61189-5-503
Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards (IEC 61189-5-503:2017); German version EN 61189-5-503:2017
Edition
2018-01
DIN EN 62884-2
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (IEC 62884-2:2017); German version EN 62884-2:2017
Edition
2018-05
DIN EN IEC 62828-2
Reference conditions and procedures for testing industrial and process measurement transmitters - Part 2: Specific procedures for pressure transmitters (IEC 62828-2:2017); German version EN IEC 62828-2:2018
Edition
2018-11
DIN EN IEC 61189-5-301
Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 5-301: General test methods for materials and assemblies - Soldering paste using fine solder particles (IEC 61189-5-301:2021); German version EN IEC 61189-5-301:2021
Edition
2022-08
DIN EN 60749-44
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016
Edition
2017-04
DIN EN IEC 61228
Fluorescent ultraviolet lamps used for tanning - Measurement and specification method (IEC 61228:2020); German version EN IEC 61228:2020
Edition
2021-05
