Semiconductor devices - Mechanical and climatic test methods - Part 14: robustness of terminations (lead integrity)
Edition 2004-01-01

Semiconductor devices - Mechanical and climatic test methods - Part 23: high temperature operating life
Edition 2004-07-01

Semiconductor devices - Micro-electromechanical devices - Part 2: tensile testing methods of thin film materials
Edition 2006-11-01

Superconductivity - Part 1: critical current measurement - DC critical current of Nb-Ti composite superconductors
Edition 2007-03-01

Superconductivity - Part 10: critical temperature measurement - Critical temperature of composite superconductors by a resistance method
Edition 2006-12-01

Superconductivity - Part 2: critical current measurement - DC critical current of Nb3Sn composite superconductors
Edition 2007-04-01

Semiconductor devices - Mechanical and climatic test methods - Part 37: board level drop test method using an accelerometer
Edition 2008-07-01

Semiconductor devices - Micro-electromechanical devices - Part 4: generic specifications for MEMS
Edition 2011-09-01

Semiconductor optoelectronic devices for fibre optic system applications - Part 2: measuring methods
Edition 2009-09-01

Semiconductor devices - Mechanical and climatic test methods - Part 29: latch-up test
Edition 2012-08-01