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NF C96-022-14 ; NF EN 60749-14:2004-01-01
Semiconductor devices - Mechanical and climatic test methods - Part 14: robustness of terminations (lead integrity)
Edition
2004-01-01
NF C96-022-23 ; NF EN 60749-23:2004-07-01
Semiconductor devices - Mechanical and climatic test methods - Part 23: high temperature operating life
Edition
2004-07-01
NF C96-050-2 ; NF EN 62047-2:2006-11-01
Semiconductor devices - Micro-electromechanical devices - Part 2: tensile testing methods of thin film materials
Edition
2006-11-01
NF C31-888-1 ; NF EN 61788-1:2007-03-01
Superconductivity - Part 1: critical current measurement - DC critical current of Nb-Ti composite superconductors
Edition
2007-03-01
NF C31-888-10 ; NF EN 61788-10:2006-12-01
Superconductivity - Part 10: critical temperature measurement - Critical temperature of composite superconductors by a resistance method
Edition
2006-12-01
NF C31-888-2 ; NF EN 61788-2:2007-04-01
Superconductivity - Part 2: critical current measurement - DC critical current of Nb3Sn composite superconductors
Edition
2007-04-01
NF C96-022-37 ; NF EN 60749-37:2008-07-01
Semiconductor devices - Mechanical and climatic test methods - Part 37: board level drop test method using an accelerometer
Edition
2008-07-01
NF C96-050-4 ; NF EN 62047-4:2011-09-01
Semiconductor devices - Micro-electromechanical devices - Part 4: generic specifications for MEMS
Edition
2011-09-01
NF C93-801-2 ; NF EN 62007-2:2009-09-01
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: measuring methods
Edition
2009-09-01
NF C96-022-29 ; NF EN 60749-29:2012-08-01
Semiconductor devices - Mechanical and climatic test methods - Part 29: latch-up test
Edition
2012-08-01