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NF A51-310 ; NF EN 13604:2013-08-24
Copper and copper alloys - Semiconductor devices, electronic and vacuum products made from high conductivity copper
Edition
2013-08-24
NF C96-022-24 ; NF EN 60749-24:2005-12-01
Semiconductor devices - Mechanical and climatic test methods - Part 24: accelerated moisture resistance - Unbiased HAST
Edition
2005-12-01
NF C96-022-33 ; NF EN 60749-33:2005-12-01
Semiconductor devices - Mechanical and climatic test methods - Part 33: accelerated moisture resistance - unbiased autoclave
Edition
2005-12-01
SN EN 60747-16-4
Semiconductor devices. Part 16-4: Microwave integrated circuits - Switches
Edition
2004-09
NF C96-022-18 ; NF EN IEC 60749-18:2019-05-31
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Edition
2019-05-31
NF C96-016-3/A2 ; NF EN 60747-16-3/A2:2017-12-08
Semiconductor devices - Part 16-3 : microwave integrated circuits - Frequency converters
Edition
2017-12-08
NF C96-016-6 ; NF EN IEC 60747-16-6:2019-08-23
Semiconductor devices - Part 16-6 : microwave integrated circuits - Frequency multipliers
Edition
2019-08-23
NF C96-022-3 ; NF EN 60749-3:2017-06-16
Semiconductor devices - Mechanical and climatic test methods - Part 3: external visual examination
Edition
2017-06-16
NF C96-435-3 ; NF EN IEC 62435-3:2020-04-17
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: data
Edition
2020-04-17
NF C96-013-1 ; NF EN IEC 60191-1:2018-03-30
Mechanical standardization of semiconductor devices - Part 1: general rules for the preparation of outline drawings of discrete devices
Edition
2018-03-30
