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Conservation of cultural heritage 2
Edition
2019-08
UNE-EN 60191-3
Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits.
Edition
2001-01-31
UNE-EN 60749-16
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
Edition
2003-11-21
UNE-EN 60749-19
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Edition
2003-11-21
UNE-EN 60749-2
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure.
Edition
2003-05-30
UNE-EN 60749-33
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Edition
2005-03-16
UNE-EN 60749-24
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Edition
2005-03-16
UNE-EN 60749-23
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Edition
2005-03-16
UNE-EN 60749-14
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Edition
2004-06-11
UNE-EN 60749-36
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Edition
2004-03-18