Search results

Search list

Results in:

301-310 of 560 results
Standards [CURRENT]

DIN EN 62359

Ultrasonics - Field characterization - Test methods for the determination of thermal and mechanical indices related to medical diagnostic ultrasonic fields (IEC 62359:2010 + Cor.:2011 + A1:2017); German version EN 62359:2011 + A1:2018
Edition 2018-09

Standards [CURRENT]

DIN EN 60357

Tungsten halogen lamps (non-vehicle) - Performance specifications (IEC 60357:2002, modified + A1:2006, modified + A2:2008 + A3:2011); German version EN 60357:2003 + Cor.:2003 + A1:2008 + A2:2008 + A3:2011 + A11:2016
Edition 2017-01

Standards [CURRENT]

DIN EN ISO 52000-1

Energy performance of buildings - Overarching EPB assessment - Part 1: General framework and procedures (ISO 52000-1:2017); German version EN ISO 52000-1:2017
Edition 2018-03

Standards [CURRENT]

DIN EN 1999-1-1

Eurocode 9: Design of aluminium structures - Part 1-1: General structural rules; German version EN 1999-1-1:2007 + A1:2009 + A2:2013
Edition 2014-03

Standards [CURRENT]

DIN 25457-1

Activity measurement methods for the clearance of radioactive substances and nuclear facility components - Part 1: Fundamentals
Edition 2024-05

Standards [CURRENT]

DIN EN 62047-19

Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (IEC 62047-19:2013); German version EN 62047-19:2013
Edition 2014-04

Standards [CURRENT]

DIN EN 61754-7-1

Fibre optic interconnecting devices and passive components - Fibre optic connector interfaces - Part 7-1: Type MPO connector family - One fibre row (IEC 61754-7-1:2014); German version EN 61754-7-1:2014
Edition 2015-08

Standards [CURRENT]

DIN EN 61076-4

Connectors with assessed quality, for use in d.c., low frequency analogue and in digital high speed data applications - Part 4: Generic specification (IEC 61076-4:1995); German version EN 61076-4:1996
Edition 1996-07

Standards [CURRENT]

DIN EN 60749-44

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016
Edition 2017-04

Standards [CURRENT]

DIN 25201-4

Design guide for railway vehicles and their components - Bolted joints - Part 4: Securing of bolted joints
Edition 2021-11

TOP